Atomic Force Microscopy: Understanding Basic Modes and

Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
- Used Book in Good Condition
This bookÂ enlightens readers onÂ the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

â€œSupplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.comâ€
Country USA
Brand Wiley
Manufacturer Wiley
Binding Hardcover
ItemPartNumber 9780470638828
UnitCount 1
EANs 9780470638828
ReleaseDate 0000-00-00

Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications