☰
Home Page
Appliances Arts, Crafts & Sewing Automotive Baby Beauty Books CDs & Vinyl Collectibles & Fine Arts Cell Phones & Accessories Clothing, Shoes & Jewellery Computers Electronics Health & Personal Care Home & Kitchen Industrial & Scientific Luggage & Travel Gear Musical Instruments Office Products Patio, Lawn & Garden Pet Supplies Software Sports & Outdoors Tools & Home Improvement Toys Video Games
Books > Subjects > Science & Math > Experiments, Instruments & Measurement > Electron Microscopes & Microscopy

Advanced Computing in Electron Microscopy
R 4,363
Advanced Computing in Electron Microscopy

Aberration-Corrected Analytical Transmission Electron Microscopy
R 3,082
Aberration-Corrected Analytical Transmission Electron Microscopy

Crystalline Lasers: Physical Processes and Operating Schemes (Laser & Optical Science & Technology Book 12)
R 12,722
Crystalline Lasers: Physical Processes and Operating Schemes (Laser & Optical Science & Technology Book 12)

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)
R 8,524
Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences, 45)

The Dolphin in History: John C. Lilly and Ashley Montagu's Captivating Exploration of Dolphin Intelligence
R 556
The Dolphin in History: John C. Lilly and Ashley Montagu's Captivating Exploration of Dolphin Intelligence

Rise of the Digital World: An opportunity India cannot afford to miss
R 556
Rise of the Digital World: An opportunity India cannot afford to miss

Introducción a la Nanotecnología (Spanish Edition)
R 665
Introducción a la Nanotecnología (Spanish Edition)

Advances in Imaging and Electron Physics (ISSN Book 130)
R 11,651
Advances in Imaging and Electron Physics (ISSN Book 130)

Advances in Imaging and Electron Physics (ISSN Book 145)
R 11,651
Advances in Imaging and Electron Physics (ISSN Book 145)

Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences Book 48)
R 4,180
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences Book 48)

70 - 80 of 100 Results