Characterization Methods for Submicron MOSFETs (The Springer International Series in Engineering and Computer Science, 352)
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Product Description
Characterization Methods for Submicron MOSFETs (The Springer International Series in Engineering and Computer Science, 352)
- Used Book in Good Condition
Technical Specifications
Country
USA
Brand
Springer
Manufacturer
Springer
Binding
Hardcover
PartNumber
Refer to Sapnet.
IsAdultProduct
Height
9.21
Length
6.14
Weight
2.5794084654
Width
0.63
ReleaseDate
1996-01-31T00:00:01Z
NumberOfItems
1
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