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Books > Engineering & Transportation > Engineering > Materials & Material Science > Testing > 144199582X
  1. Electron Energy-Loss Spectroscopy in the Electron Microscope
    Electron Energy-Loss Spectroscopy in the Electron Microscope
    Electron Energy-Loss Spectroscopy in the Electron Microscope
    Electron Energy-Loss Spectroscopy in the Electron Microscope
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  2. Electron Energy-Loss Spectroscopy in the Electron Microscope

    [144199582X]
    Delivery: 10-20 Working Days
    Customer Ratings (1 reviews)
    Price R4778.00

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Additional Information

Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level.  In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.

Specifications

Country
USA
Author
R.F. Egerton
Binding
Hardcover
EAN
9781441995827
Edition
3rd ed. 2011
ISBN
144199582X
Label
Springer
Manufacturer
Springer
NumberOfItems
1
NumberOfPages
491
PublicationDate
2011-07-29
Publisher
Springer
Studio
Springer
Most Helpful Customer Reviews

For as long as I can remember, Ray Egerton has been at the forefront of electron energy loss spectroscopy (EELS) in the transmission electron microscope (TEM). For those who want to find out more about EELS and its ability to map composition at a nanometer scale (especially for low Z elements), this book is probably the best place to start. In addition to describing such instrumentation as magnetic prisms and lenses, the author provides a review of elastic and inelastic scattering theory. Inelastic scattering, as the key to understanding EELS, and the source of the features in the EELS spectrum, is broken down into plasmons (both bulk and surface) and the characteristic atomic excitations that lead to absorption edges. Bethe's theory of energy loss from characteristic atomic excitations is laid out in sufficient detail, as is the formulation of EELS spectra in terms of the complex dielectric constant. Inelastic scattering theory is, in turn, used by the author to calculate the... Read more
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