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Contents
- Preface
- Spectroscopy Instrumentation
- Signal-to-Noise Ratio
- Principles of Interferometer Operation
- Interferometer Alignment Errors
- Motion Components and Systems
- Interferogram Data Sampling
- Data Acquisition
- The Detector
- Consideration of Optics and Interferometer Alignment
- Signal-to-Noise Ratio Enhancement Techniques
- Appendix A: Simulation of Static-Tilt Error
- Appendix B: Sampling Circuit Example
- Appendix C: Simulation of Sampling Error
- Index
Country | USA |
Author | Vidi Saptari |
Binding | Paperback |
EAN | 9780819451644 |
ISBN | 0819451649 |
Label | SPIE Publications |
Manufacturer | SPIE Publications |
NumberOfItems | 1 |
NumberOfPages | 136 |
PublicationDate | 2003-11-03 |
Publisher | SPIE Publications |
Studio | SPIE Publications |
ReleaseDate | 0000-00-00 |