Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice

Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice

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Product Description

Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.

Technical Specifications

Country
USA
Brand
Springer
Manufacturer
Springer
Binding
Paperback
PartNumber
193 black & white illustrations
IsAdultProduct
Height
9.25
Length
6.1
Weight
1.19931470528
Width
0.85
ReleaseDate
2010-10-29T00:00:01Z
NumberOfItems
1