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On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond (River Publishers Series in Electronic Materials and Devices)

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond (River Publishers Series in Electronic Materials and Devices)

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond (River Publishers Series in Electronic Materials and Devices)

R 3,547
or 4 x payments of R886.75 with Payflex

Availability: Currently in Stock
Delivery: 10-20 working days

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