☰

Rietveld Refinement: Practical Powder Diffraction Pattern Analysis using TOPAS (De Gruyter STEM)

R 3,078

or 4 x payments of R769.50 with Payflex

Availability: Currently in Stock

Delivery: 10-20 working days

Rietveld Refinement: Practical Powder Diffraction Pattern Analysis using TOPAS (De Gruyter STEM)

Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use.

This book closes the gap with a theoretical introduction for each chapter followed by a practical approach.The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.
Country USA
Brand De Gruyter
Manufacturer De Gruyter
Binding Perfect Paperback
ItemPartNumber 49061073
ReleaseDate 2018-12-17
UnitCount 1
Format Illustrated
EANs 9783110456219

You might also like...

$Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition$

Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition

$The Basics of Crystallography and Diffraction: Fourth Edition (International Union of Crystallography Texts on Crystallography)$

The Basics of Crystallography and Diffraction: Fourth Edition (International Union of Crystallography Texts on Crystallography)

Introduction to Crystallography (Dover Books on Chemistry)