VLSI Test Principles and Architectures: Design for Testability

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
- Most up-to-date coverage of design for testability.
- Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.Â
- Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Country USA
Brand Morgan Kaufmann
Manufacturer Morgan Kaufmann
Binding Hardcover
ItemPartNumber YES2043034
Model YES2043034
UnitCount 1
EANs 9780123705976
ReleaseDate 0000-00-00

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))