☰

Computers & Technology

Computer Science

VLSI Test Principles and Architectures: Design for Testability

VLSI Test Principles and Architectures: Design for Testability

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Â· Most up-to-date coverage of design for testability.
Â· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
Â· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
Â· Lecture slides and exercise solutions for all chapters are now available.
Â· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
Country USA
Brand Morgan Kaufmann
Manufacturer Morgan Kaufmann
Binding Paperback
ReleaseDate 2002-07-06
UnitCount 1
EANs 9781493300860

You might also like...

System-on-Chip Test Architectures, Volume .: Nanometer Design for Testability (Systems on Silicon)

System-on-Chip Test Architectures, Volume .: Nanometer Design for Testability (Systems on Silicon)

Design-For-Test For Digital IC's and Embedded Core Systems

Design-For-Test For Digital IC's and Embedded Core Systems

Computer Architecture: A Quantitative Approach (The Morgan Kaufmann Series in Computer Architecture and Design)

Computer Architecture: A Quantitative Approach (The Morgan Kaufmann Series in Computer Architecture and Design)

CMOS VLSI Design: A Circuits and Systems Perspective (4th Edition)

CMOS VLSI Design: A Circuits and Systems Perspective (4th Edition)

Low Power Design Essentials (Integrated Circuits and Systems)

Low Power Design Essentials (Integrated Circuits and Systems)

Digital Integrated Circuit Design Using Verilog and Systemverilog

Digital Integrated Circuit Design Using Verilog and Systemverilog