VTSYIQI Leeb Hardness Tester C Type Impact Device Smaller Thin Impact Device for Smaller Thin Compone NDT Test

VTSYIQI Leeb Hardness Tester C Type Impact Device Smaller Thin Impact Device for Smaller Thin Compone NDT Test

Product ID: B07WT1W39P Condition: New

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R 9,150
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Delivery: 10-20 working days
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Product Description

VTSYIQI Leeb Hardness Tester C Type Impact Device Smaller Thin Impact Device for Smaller Thin Compone NDT Test

  • C type probe impact device for Leeb Hardness Tester

Technical Specifications

Country
USA
Brand
VTSYIQI
Manufacturer
VTSYIQI202310111444
ItemPartNumber
C type impact device probe
Model
C type impact device
Color
Yellow
Size
Large
UnitCount
1
UPCs
797550902457
EANs
0797550902457