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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces (Springer Theses)

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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces (Springer Theses)
Country USA
Brand Springer
Manufacturer Springer
Binding Paperback
ItemPartNumber 2 black & white tables, biography
ReleaseDate 2013-05-28
UnitCount 1
EANs 9781461428572

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Country	USA
Brand	Springer
Manufacturer	Springer
Binding	Paperback
ItemPartNumber	2 black & white tables, biography
ReleaseDate	2013-05-28
UnitCount	1
EANs	9781461428572